This section of IEC 60749 specifies the rapid temperature change test method and the two-fluid bath method. When both testing methods are conducted as part of a device qualification, the results from air to air temperature cycling should prevail over this two-fluid-bath test method. This test method can also be used, with fewer cycles (e.g., 5 to 10 cycles), to examine the impact of immersing devices in heated liquids for cleaning purposes.
This test is applicable to all semiconductor devices. It is considered destructive unless otherwise detailed in the relevant specification.
Generally, this rapid temperature change and two-fluid bath method test is consistent with IEC 60068-2-1 4, but due to specific requirements of semiconductors, the provisions of this standard apply.
