This part of IEC 60909 is applicable to the calculation of short-circuit currents • in low-voltage three-phase AC systems, and • in high-voltage three-phase AC systems, operating at a nominal frequency of 50 Hz or 60 Hz. Systems at highest voltages of 550 kV and above with long transmission lines need special consideration.

This part of IEC 60898 applies to a.c. air-break circuit-breakers for operation at 50 Hz, 60 Hz or 50/60 Hz, having a rated voltage not exceeding 440 V (between phases), a rated current not exceeding 1 25 A and a rated short-circuit capacity not exceeding 25 000 A. As far as possible, it is in

This part of IEC 60855 is applicable to insulating foam-filled tubes and solid rods, of a circular cross-section, made of synthetic materials with reinforced fibreglass and intended to be used in the manufacture and construction of tools, devices and equipment for carrying out live working on electrical systems operating at voltages above 1 kV. Foam-filled

This part of IEC 60851 specifies the fllowing chemical properties tests: Test 12: Resistance to solvents; ●Test 16: Resistance to refrigerants; ●Test 17: Solderability; ●Test 20: Resistance to transformer oil. F or definitions, general notes on methods of test and the complete series of methods of test for winding wires see IEC 60851-1.

This Part 503 of IEC 60811 gives the test method for the shrinkage for sheaths.

This part of IEC 60793 contains the general specifications for both multimode and single-mode optical fibres. Sectional specifications for each of the four categories multimode fibres: A1 , A2, A3, and A4 (part of the multimode fibre class A) contain requirements specific to each category. Sectional specifications for each of the two single-mode fibre classes,

This part of IEC 60770 is applicable to transmitters which have either a standard analogue electric current output signal or a standard pneumatic output analogue signal in accordance with IEC 60381 -1 or IEC 60382. The tests detailed herein may be applied to transmitters which have other output signals, provided that due allowance is made

This part of IEC 60749 describes a test method used to determine the resistance of a semiconductor device to thermal and mechanical stresses due to cycling the power dissipation of the internal semiconductor die and internal connectors. This happens when low-voltage operating biases for forward conduction (load currents) are periodically applied and removed, causing rapid